— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvado...
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
This paper presented an overview of Chinese bi-character words' morphological types, and proposed a set of features for machine learning approaches to predict these types bas...
Several sites allow users to publish personal reviews about products and services available on the market. In this paper, we consider the problem of applying classification techniq...
Paolo Casoto, Antonina Dattolo, Paolo Omero, Nirma...
A novel method for estimating prediction uncertainty using machine learning techniques is presented. Uncertainty is expressed in the form of the two quantiles (constituting the pr...