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CORR
2010
Springer
158views Education» more  CORR 2010»
15 years 1 months ago
Efficient Approaches for Designing Fault Tolerant Reversible Carry Look-Ahead and Carry-Skip Adders
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Z...
ASPDAC
2006
ACM
159views Hardware» more  ASPDAC 2006»
16 years 12 days ago
Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology
: With technology scaling, elevated temperatures caused by increased power density create a critical bottleneck modulating the circuit operation. With the advent of FinFET technolo...
Aditya Bansal, Mesut Meterelliyoz, Siddharth Singh...
CODES
2009
IEEE
16 years 1 months ago
FRA: a flash-aware redundancy array of flash storage devices
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...
Yangsup Lee, Sanghyuk Jung, Yong Ho Song
VTS
1999
IEEE
66views Hardware» more  VTS 1999»
15 years 10 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
ICCAD
1998
IEEE
71views Hardware» more  ICCAD 1998»
15 years 10 months ago
High-level variable selection for partial-scan implementation
In this paper, we propose a high-level variable selection for partial-scan approach to improve the testability of digital systems. The testability of a design is evaluated at the ...
Frank F. Hsu, Janak H. Patel