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ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
16 years 3 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
SEFM
2009
IEEE
16 years 1 months ago
Adjusted Verification Rules for Loops Are More Complete and Give Better Diagnostics for Less
—Increasingly, tools and their underlying theories are able to cope with “real code” written as part of industrial grade applications almost as is. It has been our experience...
Patrice Chalin
FROCOS
2009
Springer
16 years 1 months ago
Combining Nonmonotonic Knowledge Bases with External Sources
The developments in information technology during the last decade have been rapidly changing the possibilities for data and knowledge access. To respect this, several declarative k...
Thomas Eiter, Gerhard Brewka, Minh Dao-Tran, Micha...
KBSE
2008
IEEE
16 years 1 months ago
Automatic Inference of Frame Axioms Using Static Analysis
Many approaches to software verification are currently semi-automatic: a human must provide key logical insights — e.g., loop invariants, class invariants, and frame axioms tha...
Zvonimir Rakamaric, Alan J. Hu
DSD
2007
IEEE
105views Hardware» more  DSD 2007»
16 years 1 months ago
Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja