7536 search results - page 1083 / 1508 » Localized Components Analysis |
174
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
189
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ISCAS
2006
IEEE
16 years 24 days ago
2006
IEEE
Abstract- We present an architecture and VLSI implemen- Various strategies in the analysis of spatio-temporal dynamtation of a distributed neural interface and spatio-temporal ics ...
177
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SIGSOFT
2004
ACM
16 years 6 days ago
2004
ACM
Static program checking tools can find many serious bugs in software, but due to analysis limitations they also frequently emit false error reports. Such false positives can easi...
169
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
Abstract-- SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This ...
221
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JBI
2004
15 years 8 months ago
2004
Microarray analysis using clustering algorithms can suffer from lack of inter-method consistency in assigning related gene-expression profiles to clusters. Obtaining a consensus s...