1863 search results - page 307 / 373 » Load-Reuse Analysis: Design and Evaluation |
145
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GLVLSI
2007
IEEE
15 years 10 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
160
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ESA
2006
Springer
15 years 9 months ago
2006
Springer
A sensor network consists of sensing devices which may exchange data through wireless communication. A particular feature of sensor networks is that they are highly energy constrai...
191
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IEAAIE
2000
Springer
15 years 9 months ago
2000
Springer
Enabling a domain expert to maintain his own knowledge in a Knowledge Based System has long been an ideal for the Knowledge Engineering community. In this paper we report on our ex...
173
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USENIX
2008
15 years 8 months ago
2008
Despite a low occurrence rate, silent data corruption represents a growing concern for storage systems designers. Throughout the storage hierarchy, from the file system down to th...
159
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CCS
2008
ACM
15 years 8 months ago
2008
ACM
To ensure that a trust negotiation succeeds whenever possible, authorization policy compliance checkers must be able to find all minimal sets of their owners' credentials tha...