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ECBS
2010
IEEE
151views Hardware» more  ECBS 2010»
15 years 12 months ago
Generating Test Plans for Acceptance Tests from UML Activity Diagrams
The Unified Modeling Language (UML) is the standard to specify the structure and behaviour of software systems. The created models are a constitutive part of the software speciļ¬...
Andreas Heinecke, Tobias Brückmann, Tobias Gr...
CAV
2003
Springer
108views Hardware» more  CAV 2003»
15 years 11 months ago
Linear Invariant Generation Using Non-linear Constraint Solving
Abstract. We present a new method for the generation of linear invariants which reduces the problem to a non-linear constraint solving problem. Our method, based on Farkas’ Lemma...
Michael Colón, Sriram Sankaranarayanan, Hen...
EVOW
2009
Springer
15 years 9 months ago
Testing Detector Parameterization Using Evolutionary Exploit Generation
Abstract. The testing of anomaly detectors is considered from the perspective of a Multi-objective Evolutionary Exploit Generator (EEG). Such a framework provides users of anomaly ...
Hilmi Günes Kayacik, A. Nur Zincir-Heywood, M...
CORR
2008
Springer
103views Education» more  CORR 2008»
15 years 6 months ago
Generating Random Graphs with Large Girth
We present a simple and efficient algorithm for randomly generating simple graphs without small cycles. These graphs can be used to design high performance Low-Density Parity-Chec...
Mohsen Bayati, Andrea Montanari, Amin Saberi
ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
15 years 10 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs