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165
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ADBIS
2009
Springer
101views Database» more  ADBIS 2009»
15 years 10 months ago
Temporal Data Classification Using Linear Classifiers
Data classification is usually based on measurements recorded at the same time. This paper considers temporal data classification where the input is a temporal database that descri...
Peter Z. Revesz, Thomas Triplet
149
Voted
ISSTA
2009
ACM
16 years 20 days ago
Time-aware test-case prioritization using integer linear programming
Techniques for test-case prioritization re-order test cases to increase their rate of fault detection. When there is a fixed time budget that does not allow the execution of all ...
Lu Zhang, Shan-Shan Hou, Chao Guo, Tao Xie, Hong M...
162
Voted
DAC
2000
ACM
16 years 7 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
160
Voted
ASYNC
2006
IEEE
92views Hardware» more  ASYNC 2006»
16 years 7 days ago
Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
Gennette Gill, Ankur Agiwal, Montek Singh, Feng Sh...
170
Voted
ESEM
2009
ACM
15 years 10 months ago
Test coverage and post-verification defects: A multiple case study
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...