3779 search results - page 207 / 756 » Linear Consistency Testing |
154
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IPPS
2006
IEEE
16 years 16 days ago
2006
IEEE
In a network consisting of several thousands computers, the occurrence of faults is unavoidable. Being able to test the behaviour of a distributed program in an environment where ...
162
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DATE
1997
IEEE
15 years 10 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
153
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VTS
1996
IEEE
15 years 10 months ago
1996
IEEE
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
179
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper presents a multiple-FPGA-based experimentation board. The problem to be solved is that of implementing a circuit into a set of FPGAs. This board provides a hardware env...
172
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AUSAI
2008
Springer
15 years 8 months ago
2008
Springer
Abstract. Bias variance decomposition for classifiers is a useful tool in understanding classifier behavior. Unfortunately, the literature does not provide consistent guidelines on...