3779 search results - page 115 / 756 » Linear Consistency Testing |
180
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CDC
2009
IEEE
15 years 7 months ago
2009
IEEE
We consider the problem of selecting a subset of p out of n sensors for the purpose of event detection, in a wireless sensor network (WSN). Occurrence or not of the event of intere...
154
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MTDT
2000
IEEE
15 years 10 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
149
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ICCAD
1995
IEEE
15 years 9 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
152
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DATE
2007
IEEE
16 years 18 days ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
153
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CISIS
2008
IEEE
16 years 22 days ago
2008
IEEE
Parallel algorithms divide computation among several threads. In many cases, the input must also be divided. Consider an input consisting of a linear sequence of elements whose le...