472 search results - page 41 / 95 » Limiting Negations in Formulas |
159
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ISQED
2008
IEEE
16 years 11 days ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
153
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FSTTCS
2004
Springer
15 years 11 months ago
2004
Springer
A computational model for learning languages in the limit from full positive data and a bounded number of queries to the teacher (oracle) is introduced and explored. Equivalence, ...
159
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ACSAC
2002
IEEE
15 years 11 months ago
2002
IEEE
Intrusion detection systems (IDSs) have reached a high level of sophistication and are able to detect intrusions with a variety of methods. Unfortunately, system administrators ne...
173
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ISLPED
2007
ACM
15 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
167
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JCC
2002
15 years 5 months ago
2002
: Constant dielectric (CD) and distance-dependent dielectric (DDD) functions are the most popular and widespread in the Molecular Mechanics simulations of large molecular systems. ...