6715 search results - page 711 / 1343 » Learning from a Test Set |
229
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SI3D
2005
ACM
16 years 25 days ago
2005
ACM
We present a sampling strategy and rendering framework for intersectable models, whose surface is implicitly defined by a black box intersection test that provides the location a...
186
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FORTE
2008
15 years 8 months ago
2008
Model programs represent transition systems that are used fy expected behavior of systems at a high level of abstraction. The main application area is application-level network pro...
221
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TIT
2010
15 years 2 months ago
2010
Abstract--Over the past three decades we have steadily increased our knowledge on the genetic basis of many severe disorders. Nevertheless, there are still great challenges in appl...
201
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CVPR
2008
IEEE
16 years 9 months ago
2008
IEEE
Visual and non-visual data are often related through complex, indirect links, thus making the prediction of one from the other difficult. Examples include the partiallyunderstood ...
174
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ICCAD
2002
IEEE
16 years 4 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...