6715 search results - page 705 / 1343 » Learning from a Test Set |
189
Voted
DATE
2003
IEEE
16 years 18 days ago
2003
IEEE
The first non-enumerative framework for diagnosing path delay faults using zero suppressed binary decision diagrams is introduced. We show that fault free path delay faults with ...
182
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ISSRE
2003
IEEE
16 years 17 days ago
2003
IEEE
A large number of coverage criteria to generate tests from logical expressions have been proposed. Although there have been large variations in the terminology, the articulation o...
197
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VTS
2003
IEEE
16 years 17 days ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
213
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ERCIMDL
2003
Springer
16 years 15 days ago
2003
Springer
Abstract. This paper presents an approach to automatically subject index fulltext documents with multiple labels based on binary support vector machines (SVM). The aim was to test ...
169
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DATE
2010
IEEE
16 years 12 days ago
2010
IEEE
—Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue...