23703 search results - page 4489 / 4741 » Learning from Demonstration |
185
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
164
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
: Double-Gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG device...
203
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
182
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Symbolic image computation is the most fundamental computation in BDD-based sequential system optimization and formal verification. In this paper, we explore the use of over-appr...
160
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
Timing closure problems occur when timing estimates computed during logic synthesis do not match with timing estimates computed from the layout of the circuit. In such a situation...