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ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
16 years 3 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
IUI
2009
ACM
16 years 3 months ago
Structuring and manipulating hand-drawn concept maps
Concept maps are an important tool to knowledge organization, representation, and sharing. Most current concept map tools do not provide full support for hand-drawn concept map cr...
Yingying Jiang, Feng Tian, XuGang Wang, Xiaolong Z...
ISBI
2009
IEEE
16 years 1 months ago
A Non-Parametric Approach to Automatic Change Detection in MRI Images of the Brain
We present a novel approach to change detection between two brain MRI scans (reference and target.) The proposed method uses a single modality to find subtle changes; and does no...
Hae Jong Seo, Peyman Milanfar
DATE
2009
IEEE
90views Hardware» more  DATE 2009»
16 years 1 months ago
Property analysis and design understanding
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
Ulrich Kühne, Daniel Große, Rolf Drechs...
ICC
2009
IEEE
138views Communications» more  ICC 2009»
16 years 1 months ago
Measuring Indoor Mobile Wireless Link Quality
—This paper investigates methods for link quality measurement of an indoor, time-varying wireless link. Link quality estimates are used for a number of higher-layer functions, in...
Andreas Wapf, Michael R. Souryal