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DATE
2007
IEEE
86views Hardware» more  DATE 2007»
16 years 26 days ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
CIVR
2007
Springer
164views Image Analysis» more  CIVR 2007»
16 years 21 days ago
Inducing a perceptual relevance shape classifier
In this paper, we develop a system to classify the outputs of image segmentation algorithms as perceptually relevant or perceptually irrelevant with respect to human perception. T...
Victoria J. Hodge, John P. Eakins, James Austin
TGC
2007
Springer
16 years 19 days ago
Adversaries and Information Leaks (Tutorial)
Secure information flow analysis aims to prevent programs from leaking their H (high) inputs to their L (low) outputs. A major challenge in this area is to relax the standard noni...
Geoffrey Smith
KDD
2005
ACM
103views Data Mining» more  KDD 2005»
16 years 13 hour ago
Key semantics extraction by dependency tree mining
We propose a new text mining system which extracts characteristic contents from given documents. We define Key semantics as characteristic sub-structures of syntactic dependencie...
Satoshi Morinaga, Hiroki Arimura, Takahiro Ikeda, ...
VLDB
2005
ACM
177views Database» more  VLDB 2005»
15 years 12 months ago
Discovering Large Dense Subgraphs in Massive Graphs
We present a new algorithm for finding large, dense subgraphs in massive graphs. Our algorithm is based on a recursive application of fingerprinting via shingles, and is extreme...
David Gibson, Ravi Kumar, Andrew Tomkins