14642 search results - page 334 / 2929 » It's Time for a Change |
172
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ASPDAC
2009
ACM
16 years 1 months ago
2009
ACM
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
180
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ICDM
2008
IEEE
16 years 1 months ago
2008
IEEE
Event detection is a critical task in sensor networks, especially for environmental monitoring applications. Traditional solutions to event detection are based on analyzing one-sh...
176
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COCOON
2004
Springer
16 years 7 days ago
2004
Springer
Abstract. The supply chain between manufacturers and retailers always includes transshipments through a network of locations. A major challenge in making demand meet supply has bee...
212
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ICALP
1997
Springer
15 years 11 months ago
1997
Springer
Rectangular hybrid automatamodel digital control programs of analog plant environments. We study rectangular hybrid automatawhere the plant state evolves continuously in real-numbe...
171
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...