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» Issues in the Integration of IN and TMN
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ATS
2001
IEEE
172views Hardware» more  ATS 2001»
15 years 10 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
EVOW
2000
Springer
15 years 10 months ago
Prediction of Power Requirements for High-Speed Circuits
Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from f...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
KR
2000
Springer
15 years 10 months ago
An Environment for Merging and Testing Large Ontologies
Large-scale ontologies are becoming an essential component of many applications including standard search (such as Yahoo and Lycos), ecommerce (such as Amazon and eBay), configura...
Deborah L. McGuinness, Richard Fikes, James Rice, ...
MA
2000
Springer
115views Communications» more  MA 2000»
15 years 10 months ago
Quantitative Evaluation of Pairwise Interactions between Agents
Abstract. Systems comprised of multiple interacting mobile agents provide an alternate network computing paradigm that integrates remote data access, message exchange and migration...
Takahiro Kawamura, Sam Joseph, Akihiko Ohsuga, Shi...
WETICE
2000
IEEE
15 years 10 months ago
Developing and Evaluating Collaborative Engineering Studios
We discuss a vision of and work in progress on a collaborative engineering environment, the Collaborative Design Studio, being developed at the Geometric and Intelligent Computing...
Jonathan Sevy, Vera Zaychik, Thomas T. Hewett, Wil...