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TVLSI
2010
15 years 26 days ago
Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM Coding
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
Shu Li, Tong Zhang
NAR
2011
209views Computer Vision» more  NAR 2011»
14 years 9 months ago
REPAIRtoire - a database of DNA repair pathways
REPAIRtoire is the first comprehensive database resource for systems biology of DNA damage and repair. The database collects and organizes the following types of information: (i) ...
Kaja Milanowska, Joanna Krwawicz, Grzegorz Papaj, ...
DAC
2009
ACM
16 years 7 months ago
Energy-aware error control coding for Flash memories
The use of Flash memories in portable embedded systems is ever increasing. This is because of the multi-level storage capability that makes them excellent candidates for high dens...
Veera Papirla, Chaitali Chakrabarti
DAC
2008
ACM
16 years 7 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2005
ACM
16 years 7 months ago
High performance computing on fault-prone nanotechnologies: novel microarchitecture techniques exploiting reliability-delay trad
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
Andrey V. Zykov, Elias Mizan, Margarida F. Jacome,...