2587 search results - page 217 / 518 » Intrusion Tolerant Systems |
172
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
153
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DSD
2008
IEEE
16 years 1 months ago
2008
IEEE
While shrinking geometries of embedded LSI devices is beneficial for portable intelligent systems, it is increasingly susceptible to influences from electrical noise, process vari...
159
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ISCA
2008
IEEE
16 years 1 months ago
2008
IEEE
Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introd...
160
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ISCAS
2007
IEEE
16 years 27 days ago
2007
IEEE
— A methodology based on supply voltage optimization for lowering the power consumption and temperature fluctuations induced skew of clock distribution networks is proposed in th...
185
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MICRO
2007
IEEE
16 years 27 days ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...