3165 search results - page 460 / 633 » Introduction to genetic algorithms |
188
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DATE
1999
IEEE
15 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
210
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VTS
1996
IEEE
15 years 10 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
205
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CEC
2007
IEEE
15 years 10 months ago
2007
IEEE
This article, which lies within the data mining framework, proposes a method to build classifiers based on the evolution of rules. The method, named REC (Rule Evolution for Classif...
143
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AUSAI
2006
Springer
15 years 10 months ago
2006
Springer
Abstract. In this paper we report preliminary findings of using cellular automata (CA) as an underlying architecture in controlling the motion of a fivelegged brittle star typed ro...
168
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GECCO
2006
Springer
15 years 10 months ago
2006
Springer
We describe a Markov chain Bayesian classification tool, SCS, that can perform data-driven classification of proteins and protein segments. Training data for interesting classific...