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» Introduction to Pattern Recognition

111

IBPRIA
2009
Springer

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Texture Measuring by Means of Perceptually-Based Fineness Functions

15 years 10 months ago

Texture Measuring by Means of Perceptually-Based Fineness Functions

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Jesús Chamorro-Martínez, Pedro Mart&...

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123

IBPRIA
2009
Springer

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Index of Balanced Accuracy: A Performance Measure for Skewed Class Distributions

15 years 10 months ago

Index of Balanced Accuracy: A Performance Measure for Skewed Class Distributions

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Vicente García, Ramón Alberto Mollin...

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124

MCS
2001
Springer

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Automatic Classification of Clustered Microcalcifications by a Multiple Classifier System

15 years 10 months ago

Automatic Classification of Clustered Microcalcifications by a Multiple Classifier System

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Pasquale Foggia, Carlo Sansone, Francesco Tortorel...

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127

SSPR
1998
Springer

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Non-linear Mapping for Feature Extraction

15 years 10 months ago

Non-linear Mapping for Feature Extraction

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Paul Scheunders, Steve De Backer, Antoine Naud

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141

IBPRIA
2007
Springer

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Structure Restriction for Tracking Through Multiple Views and Occlusions

15 years 9 months ago

Structure Restriction for Tracking Through Multiple Views and Occlusions

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Brais Martínez, A. Pérez, Luis Ferra...

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