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179
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MICRO
2006
IEEE
16 years 18 days ago
2006
IEEE
One of the major issues faced by the semiconductor industry today is that of reducing chip yields. As the process technologies have scaled to smaller feature sizes, chip yields ha...
157
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NDSS
2006
IEEE
16 years 18 days ago
2006
IEEE
Enterprise networks today carry a range of mission critical communications. A successful worm attack within an enterprise network can be substantially more devastating to most com...
182
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SBACPAD
2006
IEEE
16 years 18 days ago
2006
IEEE
Neural-inspired branch predictors achieve very low branch misprediction rates. However, previously proposed implementations have a variety of characteristics that make them challe...
204
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VLSID
2006
IEEE
16 years 18 days ago
2006
IEEE
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
147
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VTC
2006
IEEE
16 years 18 days ago
2006
IEEE
— In this paper we investigate the issues of both initial and post-initial acquisition schemes in the multiple transmit/receive antenna aided DS-CDMA downlink, when communicating...