7956 search results - page 1357 / 1592 » Into the Future |
163
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ISPASS
2007
IEEE
16 years 27 days ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
185
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IV
2007
IEEE
16 years 27 days ago
2007
IEEE
Studies show that roughly one-third of searches that are performed on the web require the user to initiate subsequent searches. Bates [1] theorized that with every search the user...
243
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LANOMS
2007
IEEE
16 years 27 days ago
2007
IEEE
—Recently there is a growing interest in accessing network measurement and status data across multiple domains, in order to detect eventual network problems which can hinder the ...
162
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MICRO
2007
IEEE
16 years 27 days ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
175
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MICRO
2007
IEEE
16 years 27 days ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...