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DATE
2005
IEEE
158views Hardware» more  DATE 2005»
16 years 8 days ago
Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled Bulk-CMOS Logic Circuits
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy
ICCV
2003
IEEE
15 years 12 months ago
The Catchment Feature Model for Multimodal Language Analysis
The Catchment Feature Model (CFM) addresses two questions in multimodal interaction: how do we bridge video and audio processing with the realities of human multimodal communicati...
Francis K. H. Quek
METRICS
2002
IEEE
15 years 11 months ago
Testability Analysis of a UML Class Diagram
Design-for-testability is a very important issue in software engineering. It becomes crucial in the case of OO designs where control flows are generally not hierarchical, but are d...
Benoit Baudry, Yves Le Traon, Gerson Sunyé
ITS
2000
Springer
91views Multimedia» more  ITS 2000»
15 years 10 months ago
The Impact of Representation on Coaching Argument Analysis
Graphical representations have long been associated with more efficient problem solving. More recently, researchers have begun looking at how representation may affect the informat...
Violetta Cavalli-Sforza
CSCWD
2005
Springer
15 years 8 months ago
The structure representation for the concurrent analysis of product assembly and disassembly
This paper presents a simple and novel structure representation supporting the assembly and disassembly planning of electromechanical products. The proposed Relationship Matrix de...
Jyh-Cheng Yu, Yi-Ming Li