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DAC
2006
ACM
16 years 7 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
CAV
2009
Springer
133views Hardware» more  CAV 2009»
16 years 6 months ago
Cardinality Abstraction for Declarative Networking Applications
ity Abstraction for Declarative Networking Applications Juan A. Navarro P?erez, Andrey Rybalchenko, and Atul Singh Max Planck Institute for Software Systems (MPI-SWS) Declarative N...
Andrey Rybalchenko, Atul Singh, Juan Antonio Navar...
MTDT
2003
IEEE
100views Hardware» more  MTDT 2003»
15 years 11 months ago
Optimal Spare Utilization in Repairable and Reliable Memory Cores
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-...
DAC
2004
ACM
16 years 7 months ago
Efficient on-line testing of FPGAs with provable diagnosabilities
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
Vinay Verma, Shantanu Dutt, Vishal Suthar
ISCA
2010
IEEE
240views Hardware» more  ISCA 2010»
15 years 11 months ago
Modeling critical sections in Amdahl's law and its implications for multicore design
This paper presents a fundamental law for parallel performance: it shows that parallel performance is not only limited by sequential code (as suggested by Amdahl’s law) but is a...
Stijn Eyerman, Lieven Eeckhout