The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ity Abstraction for Declarative Networking Applications Juan A. Navarro P?erez, Andrey Rybalchenko, and Atul Singh Max Planck Institute for Software Systems (MPI-SWS) Declarative N...
Andrey Rybalchenko, Atul Singh, Juan Antonio Navar...
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-...
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
This paper presents a fundamental law for parallel performance: it shows that parallel performance is not only limited by sequential code (as suggested by Amdahl’s law) but is a...