1624 search results - page 119 / 325 » Integrating Fault-Tolerant Techniques into the Design of Cri... |
182
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ESORICS
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. The design and implementation of security threat mitigation mechanisms in RFID systems, specially in low-cost RFID tags, are gaining great attention in both industry and ...
150
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VLSID
2005
IEEE
16 years 6 months ago
2005
IEEE
: The direct result of shrinking devices is not only higher densities but also increased switching activity and thus higher device temperatures. The variation in temperature over t...
227
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CODES
2008
IEEE
15 years 8 months ago
2008
IEEE
It is well recognized that novel computational models, devices and technologies are needed in order to sustain the remarkable advancement of CMOS-based VLSI circuits and systems. ...
191
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
185
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DAC
2011
ACM
14 years 6 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...