1598 search results - page 203 / 320 » Integrating Component Tests to System Tests |
135
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MODELS
2007
Springer
16 years 17 days ago
2007
Springer
ant Talks Abstracts Modelling Tools: Claudia Ermel: Tiger Harmen Kastenberg: GROOVE Christian Köhler: EMF Model Transformation Ákos Horváth: The VIATRA2 Model Transformation Fra...
147
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SAC
2004
ACM
15 years 12 months ago
2004
ACM
The quality of courseware development is affected by four factors: content and instructional issues; management; technical and graphical issues; and concerns of the customer. In ...
143
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ISI
2004
Springer
15 years 11 months ago
2004
Springer
Malicious insiders’ difficult-to-detect activities pose serious threats to the intelligence community (IC) when these activities go undetected. A novel approach that integrates ...
268
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PCM
2004
Springer
15 years 11 months ago
2004
Springer
In this paper, we propose a panorama-based object tracking scheme for wide-view surveillance systems that can detect and track moving objects with a pan-tilt camera. A dynamic mosa...
174
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DAC
2010
ACM
15 years 9 months ago
2010
ACM
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...