Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...
Wonyoung Kim, Meeta Sharma Gupta, Gu-Yeon Wei, Dav...
One of the main objectives of developing component-based software systems is to enable efficient building of systems through the integration of components. All component models def...
Although many defense mechanisms against buffer overflow attacks have been proposed, buffer overflow vulnerability in software is still one of the most prevalent vulnerabilities e...