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DAC
2009
ACM
16 years 7 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2004
ACM
16 years 7 months ago
ORACLE: optimization with recourse of analog circuits including layout extraction
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
Yang Xu, Lawrence T. Pileggi, Stephen P. Boyd
HPCA
2008
IEEE
16 years 7 months ago
System level analysis of fast, per-core DVFS using on-chip switching regulators
Portable, embedded systems place ever-increasing demands on high-performance, low-power microprocessor design. Dynamic voltage and frequency scaling (DVFS) is a well-known techniq...
Wonyoung Kim, Meeta Sharma Gupta, Gu-Yeon Wei, Dav...
ICSE
2004
IEEE-ACM
16 years 6 months ago
Concerning Predictability in Dependable Component-Based Systems: Classification of Quality Attributes
One of the main objectives of developing component-based software systems is to enable efficient building of systems through the integration of components. All component models def...
Ivica Crnkovic, Magnus Larsson, Otto Preiss
CF
2004
ACM
16 years 5 days ago
Repairing return address stack for buffer overflow protection
Although many defense mechanisms against buffer overflow attacks have been proposed, buffer overflow vulnerability in software is still one of the most prevalent vulnerabilities e...
Yong-Joon Park, Gyungho Lee