: Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in – and even fewer can win. Hear how senior technologists from the world’s t...
G. Singer, Philippe Magarshack, Dennis Buss, F.-C....
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
Jie Hu, Greg M. Link, Johnsy K. John, Shuai Wang, ...
Abstract— We explore network design principles for nextgeneration all-optical wide-area networks, employing light-trail technology. Light-trail [1] is a light-wave circuit that a...
Srivatsan Balasubramanian, Ahmed E. Kamal, Arun K....
Performance analysis gains more attention in recent years by researchers who focus their study on the early software development stages to mitigate the risk of redesign as problem...