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133
Voted
DAC
2005
ACM
16 years 7 months ago
2005
ACM
We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
199
Voted
DAC
2005
ACM
16 years 7 months ago
2005
ACM
: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...
156
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
This paper presents an efficient hierarchical 3D capacitance extraction algorithm -- ICCAP. Most previous capacitance extraction algorithms introduce intermediate variables to fac...
155
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Existing Full-wave Model Order Reduction (FMOR) approaches are based on Expanded Taylor Series Approximations (ETAS) of the oscillatory full-wave system matrix. The accuracy of su...
162
click to vote
DAC
2005
ACM
16 years 7 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...