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175
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
166
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
The classic algorithm for optimal buffer insertion due to van Ginneken has time and space complexity O(n2 ), where n is the number of possible buffer positions. We present a new a...
167
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
154
Voted
DAC
2004
ACM
16 years 7 months ago
2004
ACM
We present a set of techniques for placement-coupled, timingdriven logic replication. Two components are at the core of the approach. First is an algorithm for optimal timingdrive...
149
Voted
DAC
2004
ACM
16 years 7 months ago
2004
ACM
Thermal design in sub-100nm technologies is one of the major challenges to the CAD community. In this paper, we first introduce the idea of temperature-aware design. We then propo...