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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
16 years 27 days ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
TCSV
2011
15 years 1 months ago
Formulating Team-Sport Video Summarization as a Resource Allocation Problem
—We propose a flexible framework to summarize team-sport videos that have been originally produced for broadcast purposes. The framework is able to integrate both the knowledge ...
Fan Chen, Christophe De Vleeschouwer
DSN
2000
IEEE
15 years 11 months ago
A Low Latency, Loss Tolerant Architecture and Protocol for Wide Area Group Communication
Group communication systems are proven tools upon which to build fault-tolerant systems. As the demands for fault-tolerance increase and more applications require reliable distrib...
Yair Amir, Claudiu Danilov, Jonathan Robert Stanto...
ICCAD
2004
IEEE
128views Hardware» more  ICCAD 2004»
16 years 3 months ago
Power estimation for cycle-accurate functional descriptions of hardware
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
Lin Zhong, Srivaths Ravi, Anand Raghunathan, Niraj...
CODES
2005
IEEE
16 years 3 days ago
Comparing two testbench methods for hierarchical functional verification of a bluetooth baseband adaptor
The continuous improvement on the design methodologies and processes has made possible the creation of huge and very complex digital systems. Design verification is one of the mai...
Edgar L. Romero, Marius Strum, Wang Jiang Chau