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DAC
2006
ACM
16 years 7 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
ICCAD
2002
IEEE
161views Hardware» more  ICCAD 2002»
16 years 3 months ago
Non-tree routing for reliability and yield improvement
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
Andrew B. Kahng, Bao Liu, Ion I. Mandoiu
ISPASS
2006
IEEE
16 years 15 days ago
Modeling TCAM power for next generation network devices
Applications in Computer Networks often require high throughput access to large data structures for lookup and classification. Many advanced algorithms exist to speed these searc...
Banit Agrawal, Timothy Sherwood
UIST
2006
ACM
16 years 13 days ago
ModelCraft: capturing freehand annotations and edits on physical 3D models
With the availability of affordable new desktop fabrication techniques such as 3D printing and laser cutting, physical models are used increasingly often during the architectural ...
Hyunyoung Song, François Guimbretièr...
ECWEB
2005
Springer
136views ECommerce» more  ECWEB 2005»
16 years 19 hour ago
Music Rights Clearance Business Analysis and Delivery
Abstract. Semantic Web Services can be seen as remote Problem Solving Methods offered via the Web through platform and language independent interfaces. They can be seamlessly inte...
Carlos Pedrinaci, Ziv Baida, Hans Akkermans, Amaia...