1724 search results - page 246 / 345 » Industrial applications |
159
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
182
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DAC
2001
ACM
16 years 7 months ago
2001
ACM
Trends in the semiconductor industry towards extensive design and code reuse motivate a need for adequate Intellectual Property Protection (IPP) schemes. We offer a new general IP...
158
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
The classic algorithm for optimal buffer insertion due to van Ginneken has time and space complexity O(n2 ), where n is the number of possible buffer positions. We present a new a...
127
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ICSE
2009
IEEE-ACM
16 years 7 months ago
2009
IEEE-ACM
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
149
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SIGSOFT
2009
ACM
16 years 7 months ago
2009
ACM
A large number of industrial concurrent programs are being designed based on a model which combines threads with event-based communication. These programs consist of several threa...