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CORR
2010
Springer
34views Education» more  CORR 2010»
15 years 6 months ago
Statistical Modelling of ft to Process Parameters in 30 nm Gate Length Finfets
This paper investigates the effect of process variations on unity gain frequency (ft) in 30 nm gate length FinFET by performing extensive TCAD simulations. Six different geometric...
B. Lakshmi, R. Srinivasan
BPM
2007
Springer
211views Business» more  BPM 2007»
15 years 10 months ago
Towards a Reference Process Model for Event Management
Events are becoming more and more important for companies as an instrument of marketing communication. Event management is an interdisciplinary task field, addressed in the most di...
Oliver Thomas, Bettina Hermes, Peter Loos
NIPS
2000
15 years 8 months ago
Sparse Representation for Gaussian Process Models
We develop an approach for a sparse representation for Gaussian Process (GP) models in order to overcome the limitations of GPs caused by large data sets. The method is based on a...
Lehel Csató, Manfred Opper
ANOR
2002
57views more  ANOR 2002»
15 years 6 months ago
Redefining Event Variables for Efficient Modeling of Continuous-Time Batch Processing
Abstract: We define events so as to reduce the number of events and decision variables needed for modeling batchscheduling problems such as described in [Westenberger and Kallrath ...
Siqun Wang, Monique Guignard
KDD
2010
ACM
435views Data Mining» more  KDD 2010»
15 years 10 months ago
Topic models with power-law using Pitman-Yor process
One of the important approaches for Knowledge discovery and Data mining is to estimate unobserved variables because latent variables can indicate hidden and specific properties o...
Issei Sato, Hiroshi Nakagawa