1925 search results - page 158 / 385 » Incremental test collections |
155
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VTS
1999
IEEE
15 years 11 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
173
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CIE
2006
Springer
15 years 10 months ago
2006
Springer
Abstract. Graph isomorphism (GI) is one of the few remaining problems in NP whose complexity status couldn't be solved by classifying it as being either NP-complete or solvabl...
162
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DAC
1995
ACM
15 years 10 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
173
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ACISICIS
2010
IEEE
15 years 8 months ago
2010
IEEE
Abstract--User-system interaction is sometimes a cumbersome element of non-textual information access. Image retrieval systems now incorporate various interaction mechanisms. Howev...
157
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EDM
2008
15 years 8 months ago
2008
In this paper we describe an educational data mining (EDM) case study based on the data collected during the online assessment of students who were able to immediately receive tail...