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MTV
2005
IEEE
138views Hardware» more  MTV 2005»
15 years 12 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
SAC
2005
ACM
15 years 12 months ago
SVD-based collaborative filtering with privacy
Collaborative filtering (CF) techniques are becoming increasingly popular with the evolution of the Internet. Such techniques recommend products to customers using similar users...
Huseyin Polat, Wenliang Du
ITC
2003
IEEE
118views Hardware» more  ITC 2003»
15 years 11 months ago
Method of reducing contactor effect when testing high-precision ADCs
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...
Gwenolé Maugard, Carsten Wegener, Tom O'Dwy...
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
15 years 11 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
PDP
2003
IEEE
15 years 11 months ago
Architectural concerns in distributed and mobile collaborative systems
Organizations increasingly coordinate their product and service development processes to deliver their products and services as fast as possible, and to involve employees, custome...
Schahram Dustdar, Harald Gall