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DATE
2006
IEEE
91views Hardware» more  DATE 2006»
16 years 17 days ago
How OEMs and suppliers can face the network integration challenges
Systems integration is a major challenge in many industries. Systematic analysis of the complex integration effects, especially with respect to timing and performance, significant...
Kai Richter, Rolf Ernst
DATE
2006
IEEE
85views Hardware» more  DATE 2006»
16 years 17 days ago
Test set enrichment using a probabilistic fault model and the theory of output deviations
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
Zhanglei Wang, Krishnendu Chakrabarty, Michael G&o...
GMP
2006
IEEE
114views Solid Modeling» more  GMP 2006»
16 years 17 days ago
A Step Towards Automated Design of Side Actions in Injection Molding of Complex Parts
Side actions contribute to mold cost by resulting in an additional manufacturing and assembly cost as well as by increasing the molding cycle time. Therefore, generating shapes of ...
Ashis Gopal Banerjee, Satyandra K. Gupta
TAICPART
2006
IEEE
16 years 15 days ago
On the Testing Maturity of Software Producing Organizations
This paper presents data from a study of the current state of practice of software testing. Test managers from twelve different software organizations were interviewed. The interv...
Mats Grindal, Jeff Offutt, Jonas Mellin
VALUETOOLS
2006
ACM
16 years 14 days ago
Splitting with weight windows to control the likelihood ratio in importance sampling
Importance sampling (IS) is the most widely used efficiency improvement method for rare-event simulation. When estimating the probability of a rare event, the IS estimator is the ...
Pierre L'Ecuyer, Bruno Tuffin