4355 search results - page 513 / 871 » Increasing Kolmogorov Complexity |
161
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
transistors the design of the SoC needs to be moved to a higher level of abstraction. We need to think in processors and interconnects rather than gates and wires. We discuss the n...
159
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
158
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
The increasing complexity of embedded systems pushes system designers to higher levels of abstraction. Transaction Level Modeling (TLM) has been proposed to model ation in systems...
153
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DFT
2006
IEEE
16 years 25 days ago
2006
IEEE
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
185
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ETS
2006
IEEE
16 years 25 days ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...