4355 search results - page 473 / 871 » Increasing Kolmogorov Complexity |
170
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
160
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
131
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
122
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Networks-on-Chip (NoCs) represent a promising solution to complex on-chip communication problems. The NoC communication architectures considered so far are based on either complete...
129
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
With the increase of design complexities and the decrease of minimal feature sizes, IP reuse is becoming a common practice while crosstalk is becoming a critical issue that must b...