Current schema matching approaches still have to improve for very large and complex schemas. Such schemas are increasingly written in the standard language W3C XML schema, especia...
— The amount of time and resources that have to be spent on debugging of embedded cores continuously increases. Approaches valid 10 years ago can no longer be used due to the var...
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...