2024 search results - page 116 / 405 » Improving quality, one process change at a time |
119
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ICCAD
2002
IEEE
16 years 3 months ago
2002
IEEE
Design ECO commonly happens in industry due to constraints or target changes from manufacturing, marketing, reliability, or performance. At each step, designers usually want to mo...
155
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ICIP
2006
IEEE
16 years 8 months ago
2006
IEEE
We propose an adaptive lifted discrete wavelet transform to locally adapt the ltering direction to the geometric ow in the image. The proposed approach re nes previous directional...
139
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
Commonly used speech enhancement algorithms estimate the power spectral density of the noise to be removed, or make a decision about the presence of speech in a particular frame, ...
176
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TCAD
2008
15 years 6 months ago
2008
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures due to the copper cladding process. To improve via yield and reliability, ...
161
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ICIP
2004
IEEE
16 years 8 months ago
2004
IEEE
The location, type, and severity of external defects on hardwood logs and stems are the primary indicators of overall log quality and value. External defects provide hints about t...