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ATS
2000
IEEE
145views Hardware» more  ATS 2000»
15 years 11 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
ISQED
2010
IEEE
127views Hardware» more  ISQED 2010»
15 years 5 months ago
Limits of bias based assist methods in nano-scale 6T SRAM
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Bent...
CF
2005
ACM
15 years 8 months ago
Drowsy region-based caches: minimizing both dynamic and static power dissipation
Power consumption within the memory hierarchy grows in importance as on-chip data caches occupy increasingly greater die area. Among dynamic power conservation schemes, horizontal...
Michael J. Geiger, Sally A. McKee, Gary S. Tyson
KDD
2007
ACM
155views Data Mining» more  KDD 2007»
16 years 7 months ago
Mining templates from search result records of search engines
Metasearch engine, Comparison-shopping and Deep Web crawling applications need to extract search result records enwrapped in result pages returned from search engines in response ...
Hongkun Zhao, Weiyi Meng, Clement T. Yu
DASFAA
2011
IEEE
206views Database» more  DASFAA 2011»
14 years 10 months ago
A Hybrid Algorithm for Finding Top-k Twig Answers in Probabilistic XML
Abstract. Uncertainty is inherently ubiquitous in data of real applications, and those uncertain data can be naturally represented by the XML. Matching twig pattern against XML dat...
Bo Ning, Chengfei Liu