We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Bent...
Power consumption within the memory hierarchy grows in importance as on-chip data caches occupy increasingly greater die area. Among dynamic power conservation schemes, horizontal...
Metasearch engine, Comparison-shopping and Deep Web crawling applications need to extract search result records enwrapped in result pages returned from search engines in response ...
Abstract. Uncertainty is inherently ubiquitous in data of real applications, and those uncertain data can be naturally represented by the XML. Matching twig pattern against XML dat...