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170
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
With the increasing levels of variability and randomness in the characteristics and behavior of manufactured nanoscale structures and devices, achieving performance optimization u...
172
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MICRO
2006
IEEE
16 years 26 days ago
2006
IEEE
Design variability due to die-to-die and within-die process variations has the potential to significantly reduce the maximum operating frequency and the effective yield of high-p...
159
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MICRO
1998
IEEE
15 years 11 months ago
1998
IEEE
The fill unit is the structure which collects blocks of instructions and combines them into multi-block segments for storage in a trace cache. In this paper, we expand the role of...
146
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Programmable circuit design has played an important role in improving design productivity over the last few decades. By imposing structure on the design, efficient automation of s...
177
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
As CMOS technology scales into the nanometer regime, power dissipation and associated thermal concerns in high-performance ICs due to on-chip hot-spots and thermal gradients are b...