17329 search results - page 3076 / 3466 » Improved non-approximability results |
175
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ISPASS
2007
IEEE
16 years 1 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
191
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ISVLSI
2007
IEEE
16 years 1 months ago
2007
IEEE
As power consumption of the clock tree dominates over 40% of the total power in modern high performance VLSI designs, measures must be taken to keep it under control. One of the m...
186
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ISVLSI
2007
IEEE
16 years 1 months ago
2007
IEEE
— Y -interconnects for VLSI chips are based on the use of global and semi-global wiring in only 0◦ , 60◦ , and 120◦ . Though X-interconnects are fast replacing the traditio...
189
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IWPSE
2007
IEEE
16 years 1 months ago
2007
IEEE
The starting point for software evolution is usually a change request, expressing the new or updated requirements on the delivered system. The requirements specified in a change ...
168
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KBSE
2007
IEEE
16 years 1 months ago
2007
IEEE
Software compatibility testing is an important quality assurance task aimed at ensuring that component-based software systems build and/or execute properly across a broad range of...