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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
15 years 8 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
WSC
2004
15 years 8 months ago
Simulation Experiment for Improving Construction Processes
From the perspective of flow analysis, the more complex the project, the more wastes are prone to build up, due to the increasing number of interfaces between activities. When pro...
Shihyi Wang, Daniel W. Halpin
BMCBI
2006
75views more  BMCBI 2006»
15 years 6 months ago
Improving the specificity of high-throughput ortholog prediction
Background: Orthologs (genes that have diverged after a speciation event) tend to have similar function, and so their prediction has become an important component of comparative g...
Debra L. Fulton, Yvonne Y. Li, Matthew R. Laird, B...
TSP
2008
146views more  TSP 2008»
15 years 6 months ago
Improved M-FOCUSS Algorithm With Overlapping Blocks for Locally Smooth Sparse Signals
Abstract-- The FOCal Underdetermined System Solver (FOCUSS) algorithm has already found many applications in signal processing and data analysis, whereas the regularized MFOCUSS al...
Rafal Zdunek, Andrzej Cichocki
MICCAI
2006
Springer
16 years 7 months ago
Carotid Artery and Jugular Vein Tracking and Differentiation Using Spatiotemporal Analysis
David Wang, Roberta L. Klatzky, Nikhil Amesur, Geo...