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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2003
ACM
16 years 7 months ago
Optimal integer delay budgeting on directed acyclic graphs
Delay budget is an excess delay each component of a design can tolerate under a given timing constraint. Delay budgeting has been widely exploited to improve the design quality. W...
Elaheh Bozorgzadeh, Soheil Ghiasi, Atsushi Takahas...
ICML
2000
IEEE
16 years 7 months ago
Discovering Homogeneous Regions in Spatial Data through Competition
If all features causing heterogeneity were observed, a mixture of experts approach (Jacobs et al., 1991) is likely to be superior to using a single model. When unobserved or very n...
Slobodan Vucetic, Zoran Obradovic
ICML
1999
IEEE
16 years 7 months ago
Distributed Value Functions
Many interesting problems, such as power grids, network switches, and tra c ow, that are candidates for solving with reinforcement learningRL, alsohave properties that make distri...
Jeff G. Schneider, Weng-Keen Wong, Andrew W. Moore...
ICML
1999
IEEE
16 years 7 months ago
Lazy Bayesian Rules: A Lazy Semi-Naive Bayesian Learning Technique Competitive to Boosting Decision Trees
Lbr is a lazy semi-naive Bayesian classi er learning technique, designed to alleviate the attribute interdependence problem of naive Bayesian classi cation. To classify a test exa...
Zijian Zheng, Geoffrey I. Webb, Kai Ming Ting
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