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VLSID
2007
IEEE
152views VLSI» more  VLSID 2007»
16 years 7 months ago
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip K...
VLSID
2005
IEEE
224views VLSI» more  VLSID 2005»
16 years 7 months ago
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
OSDI
2008
ACM
16 years 7 months ago
Device Driver Safety Through a Reference Validation Mechanism
Device drivers typically execute in supervisor mode and thus must be fully trusted. This paper describes how to move them out of the trusted computing base, by running them withou...
Dan Williams, Emin Gün Sirer, Fred B. Schneid...
276
Voted
VLDB
2007
ACM
137views Database» more  VLDB 2007»
16 years 6 months ago
Improving Data Quality: Consistency and Accuracy
Two central criteria for data quality are consistency and accuracy. Inconsistencies and errors in a database often emerge as violations of integrity constraints. Given a dirty dat...
Gao Cong, Wenfei Fan, Floris Geerts, Xibei Jia, Sh...
SIGMOD
2005
ACM
157views Database» more  SIGMOD 2005»
16 years 6 months ago
Meta-data version and configuration management in multi-vendor environments
Nearly all components that comprise modern information technology, such as Computer Aided Software Engineering (CASE) tools, Enterprise Application Integration (EAI) environments,...
John R. Friedrich
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