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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2000
ACM
16 years 7 months ago
Code compression for low power embedded system design
erse approaches at all levels of abstraction starting from the physical level up to the system level. Experience shows that a highlevel method may have a larger impact since the de...
Haris Lekatsas, Jörg Henkel, Wayne Wolf
MICCAI
2005
Springer
16 years 7 months ago
Exploiting Temporal Information in Functional Magnetic Resonance Imaging Brain Data
Functional Magnetic Resonance Imaging(fMRI) has enabled scientists to look into the active human brain, leading to a flood of new data, thus encouraging the development of new data...
Lei Zhang 0002, Dimitris Samaras, Dardo Tomasi, Ne...
KDD
2006
ACM
174views Data Mining» more  KDD 2006»
16 years 7 months ago
Onboard classifiers for science event detection on a remote sensing spacecraft
Typically, data collected by a spacecraft is downlinked to Earth and pre-processed before any analysis is performed. We have developed classifiers that can be used onboard a space...
Ashley Davies, Benjamin Cichy, Dominic Mazzoni, Ng...
OSDI
2006
ACM
16 years 6 months ago
CRAMM: Virtual Memory Support for Garbage-Collected Applications
Existing virtual memory systems usually work well with applications written in C and C++, but they do not provide adequate support for garbage-collected applications. The performa...
Ting Yang, Emery D. Berger, Scott F. Kaplan, J. El...
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