3201 search results - page 305 / 641 » High Quality Hatching |
163
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ITC
1997
IEEE
15 years 11 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
148
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ITC
1997
IEEE
15 years 11 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
161
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ICCAD
1996
IEEE
15 years 11 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
203
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GI
1997
Springer
15 years 11 months ago
1997
Springer
This paper gives an overview of an architecture and search organization for large vocabulary, continuous speech recognition (LVCSR at RWTH). In the rst part of the paper, we descri...
187
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ICCAD
1994
IEEE
15 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...